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The Challenge:
The challenge was to develop a test system for functionality checks on electronic sub assemblies capable of handling large amounts of data, high speed measurements, high speed logging, and real time analysis on a windows environment
The Solution:
Using the capabilities of National Instruments high speed multifunction DAQ devices and the graphical and analysis features of LabVIEW a portable, flexible, and functional solution was provided.
Introduction:
Reliable sub systems are the secret to any successful large system. In this project we had to perform complete functional tests for electronic sub assemblies that were later integrated into larger systems. Detailed test reports were to be generated for easy reference.
System Requirements
The requirement was to provide a portable test system that could perform complete functional tests for subassemblies. There were four parts to the project.
Event Monitoring and Analysis: The subassemblies communicate amongst each other using current pulses. There were a maximum of 64 channels on which the pulses could occur. The test system had to measure the occurrence time for each pulse and its pulse width with an accuracy of 100 microseconds. After detecting a pulse the system had to compare the pulse with records in a look up table. Depending on the comparison the system determined if the pulse had ‘passed’ or ‘failed’. Logging of the entire data was also required.
Arbitrary Waveform Generator: The arbitrary waveform generator was used to simulate pulses to the sub assemblies. The user could create custom waveform patterns and store them as files for later use.
General Purpose Analog and Digital Acquisition: The system could also be used for various checks like vehicle sign checks, Frequency/Step response, and battery characterization. The system had a maximum of 64 analog channels and 96 digital lines. The system could also read data from 24 isolated digital lines and generate outputs on 24 isolated digital lines for driving relays.
High Speed Digitizer: The High Speed Digitizer needs to be used as a scope to debug faulty channels in the subassemblies.
Hardware selection
Since the system had to be portable and had to be used in an industrial environment a PXI based system was used. The PXI-6071E was used as the multifunction DAQ card for the application. The maximum sampling rate of 640kS/s was well within the limits of the card. To generate the custom waveform patterns the PXI-5411 Arbitrary Waveform Generator card was used. For General Purpose Analog and Digital Acquisition the same PXI-6071E was used as the analog card. The digital card selected was the PXI-6508 for its 96 DIO lines. The PXI-6527 was used for the isolated digital I/O lines. For debugging faulty channels the PXI-5112 High Speed Digitizer was provided which was used as a high resolution scope. A LCD unit was used as display with an integrated keyboard for user inputs.
A custom connector block using D3A999 connectors was provided along with the system for easy connection/disconnection to the electronic subsystems. A 15” TFT foldable Display with built-in keyboard was also provided this along with the PXI based system made for a rugged, portable and powerful test system.
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