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Automated Electronic Cluster Test System Back

 

Pickering Interfaces, a market innovator in signal switching and conditioning in association with Captronic Systems one of the leading Automation and Test equipment Specialists, cordially invite
you for a Seminar on, “NEXT GENERATION SWITCHING SYSTEMS” Covering latest Switching Technologies and Platforms offered by Pickering Interfaces and usage of these system in solutions implemented by Captronic Systems for the Automotive, Aerospace & Defence and Manufacturing companies. It will also cover the world's highest density switching matrix (the BRIC modules), RF
and optical switching products, It will address application of switches in HILS, Fault Insertion, and Automated Test Equipment

The Solution:

Utilize the flexibility & ruggedness of NI Compact fieldpoint modules and the graphical features of LabVIEW to build a configurable, expandable functional test bench which will minimize testing time and maximize productivity.

Introduction:

Cluster assembly in an automobile includes the speedometer, tachometer, fuel gauge, temperature gauge, odometer and a set of telltale lamps. Conventional clusters have mechanical parts which in addition to being cumbersome will give erroneous results. In contrast electronic clusters have less weight, longer life and gives more accurate results. The test system to be developed was for the end-of- line functional testing of electronic clusters. The main requirements for the test setup were

  • Voltage as well as current measurement capabilities
  • Ability to turn ON and turn OFF sinking & sourcing LEDs
  • Ability to drive electromechanical relays
  • Ability to generate square wave of variable frequency
  • Compactness, Ruggedness and reliability
  • Provisions for future expansion
  • Ability to store test data into a database
  • Generation of reports from test data
  • Simulation of test sequence in software.

National Instrument’s Compact FieldPoint (cFP) distributed I/O system supported all the above functionalities. Analog Input cFP modules were used to measure both voltage and current, sinking and sourcing DO modules were used to activate LEDs and to drive relays. Since required frequency resolution was high NI Basic DAQ card was used to generate square waves. Also the modularity of FieldPoint modules allowed scope for future expansion. The test software was developed using LabVIEW 7.0 whose excellent graphical capabilities came handy while creating user interface and doing test simulation. Database connectivity toolkit for LabVIEW was used to log the test data and to store test configuration to an MS Access database.

Application:

In the end- of –line functional testing of electronic clusters, various conditions like speed, engine RPM, fuel tank level etc. were simulated through hardware and were applied to the respective pins of the cluster and its behavior to these inputs were noted. The speedometer & tachometer required frequency inputs while the fuel and temperature gauge required resistance inputs. The tests include sweeping of speedometer and tachometer from minimum to maximum and back, applying square waves of frequencies equivalent to known speed and RPM and testing whether indicated values in speedometer and tachometer are within acceptable limits or not, checking of fuel gauge and temperature gauge indications by applying corresponding resistance inputs, measurement of telltale lamp currents and switching of f telltale lamps to check for light leakage.

There were a total of 22 telltale lamps, one speedometer, one tachometer, one temperature gauge and one fuel gauge. There were five cluster variants and the number of telltale lamps present was different for each variant. Also the maximum range of speedometer and tachometer also varied depending on cluster selected.

During the test, the cluster assembly had to be held stationary by a set of pneumatically actuated clamps. Also the entire test hardware including power supplies and pneumatics were to be mounted in a suitable rack.

System Design:

Taking into account the different types of I/Os required for the test setup, the reliability, ruggedness and modularity required and also the space constraint, we opted Compact field point modules for the test system and LabVIEW 7.0 for developing the test software because of its rich GUI features and seamless integration with cFP hardware which helped in reducing development time. For square wave generation NI Basic DAQ was used because of the high frequency resolution required. The application software runs on a touch screen panel PC that communicates with the cFP 2000 controller through Ethernet.

There were two types of telltales- sourcing LEDs and sinking LEDs. To activate sourcing LEDs, cFP DO 401 was used and to activate sinking LEDs, cFP DO 403 was used. The fuel gauge and temperature gauge resistance switching was implemented using electromechanical relays. These relays as well as the solenoids for activating the pneumatic cylinders in the cluster holding assembly were activated with the help of another cFP DO 401 module. Telltale current were measured with the help of cFP AI 110 modules. A limit switch ensures that the female connector in the test fixture is mating properly with male connector in the cluster. Also a pressure switch was used to ensure that the air pressure is always maintained above 6 bars. An emergency switch was also provided with which the user can abort a test and unclamp the cluster by bypassing the test software. The states of the limit switch, the pressure switch and the emergency switch were monitored through cFP DI 301 module.

To test a cluster the user has to insert the cluster into the test fixture and press the ‘Start test’ switch. After this the pneumatic cylinders will be actuated which will hold the cluster in its position and the cluster will be powered ON and the test will start. At the completion of the entire test sequence, if the cluster has passed the tests, the software generates a unique serial number and a barcode will be printed. If a cluster fails the test, then a sticker with fault identification code will be generated.

Software Implementation:

There were five variants that were to be tested with the test system. Each variant differed in the number of telltale lamps, speedometer and tachometer ranges and the number of checkpoints required. The information for each cluster was stored in a cluster database. Based on the variant selected, the corresponding information was retrieved from the database.

 
 

Based on the cluster variant selected by the user, a master cluster showing the expected behavior will be displayed on the screen, which helps the user to compare the expected behavior and actual behavior. The results of the test are stored in a results database that is also an MS Access database. The FieldPoint item tags and channel information will be stored in the ‘IO_Config’ database. All the database operations are implemented using Database Connectivity Toolkit for LabVIEW.

The test software can be divided into three basic parts. First is the configuration part, which takes care of cluster information as well as I/O configuration information. The functions involve extraction of information of selected cluster from the cluster database and IO details from the ‘IO_Config’ database.

Based on the inputs from the first stage, the second stage, which is the testing stage, will determine the number of test sequence and the various test parameters. The tests are sequenced in such a way that the entire test takes the minimum amount of time.

 
 

At the end of the entire sequence the result is stored into the results database and depending on whether the test was passed or not barcode or fault identification code will be printed.

The third stage is the report generation stage in which the user will be able to take the report of previous tests, which are there in the database. Since all the data is available in a data base the report includes parameters necessary for Statistical Process Control like number of clusters failed, number of failures under different categories etc.

Conclusion:

The test system blended properly with the production flow because of the highly reliable NI hardware and the user-friendly test software. The customer was not only able to speed up the testing process and bring down defective clusters shipped to zero but was also able to use the data from the test bench to fine tune the production process. All this was possible at one-fourth the cost of a ready to use tester because of the configurable solution offered through the Virtual Instrumentation approach.

 
 
 
     
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